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Презентация на тему Optical identification using imperfections in 2D materials
Содержание
- 2. IntroductionThe ability to uniquely identify an object
- 3.
- 4. ObjectiveTo analise a proposed simple optical technique to read unique information from nanometer-scale defects in 2D materials.
- 5. TasksMethodResults for WS2 from mechanically exfoliationResults for WS2 from chemical vapor depositionConclusion
- 6. MethodMeasurement apparatus, in which the photoluminescence from
- 7. Angular orientations of the BPF determines the
- 8. Concept of the angular selective transmissionChanging the
- 9. Makeup of PUFThe BPF angular orientation θ, the
- 10. Results for WS2 from mechanically exfoliation
- 11. Results for WS2 from chemical vapor depositionAngular-dependent
- 12. Angular dependent PL images of WS2 monolayer
- 13. Скачать презентацию
- 14. Похожие презентации
IntroductionThe ability to uniquely identify an object or device is important for authentication. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce.
Слайд 4
Objective
To analise a proposed simple optical technique to read
unique information from nanometer-scale defects in 2D materials.
Слайд 5
Tasks
Method
Results for WS2 from mechanically exfoliation
Results for WS2
from chemical vapor deposition
Conclusion
Слайд 6
Method
Measurement apparatus, in which the photoluminescence from a
monolayer TMD is collected by an objective lens (OL),
selectively transmitted through a rotatable optical bandpass filter (BPF), finally imaged on a CCD sensor.Слайд 7 Angular orientations of the BPF determines the center-wavelength
of its pass band, which varies with incidence angle
Слайд 8
Concept of the angular selective transmission
Changing the BPF
angle lights up a random subset of pixels on
the CCD; red, green and blue conceptually correspond to positions on the monolayer TMD that emits in differing energy ranges. When no filter is present, all energies are picked up.
Слайд 9
Makeup of PUF
The BPF angular orientation θ, the corresponding
BPF bandwidth, and the spatially varying photoluminescence of the
monolayer TMD PL makes up the physical unclonable function.
Слайд 10
Results for WS2 from mechanically exfoliation
50× Optical image of the exfoliated flake on PDMS. μ-PL map of
this flake was recorded with 532 nm excitation and 100 μW excitation power at 300 K. The integration time for each pixel is 0.5 s.
Слайд 11
Results for WS2 from chemical vapor deposition
Angular-dependent PL
images of monolayer flake, excited by 450 nm laser, collected using
50× (a)–(c) and 10× (d)–(f) respectively.Слайд 12 Angular dependent PL images of WS2 monolayer flake,
